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T/CASAS 030-2023 Active
T/CASAS 030-2023 Test Method for GaN Millimeter-Wave Front-End Chips
Abstract
Main technical content: T/CASAS 030—2023, "Test Methods for GaN Millimeter-Wave Front-End Chips", describes the terminology, definitions, test conditions, test requirements, and test methods of GaN millimeter-wave front-end chips. It combines the experience summarized by researchers in the field of millimeter-wave GaN front-end chips in recent years in terms of R&D, test evaluation, and application, and provides detailed regulations for the test methods of the performance indicators of millimeter-wave GaN front-end chips, including but not limited to test purposes, test environments, test methods and steps, test tools and instruments, etc.
General Product Information
| Document Type | Group standards |
|---|---|
| Standard Status | Active |
| Standard Code | T/CASAS 030-2023 |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2023-07-01 |
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