GB/T 14140.1-1993
Replaced
GB/T 5252-2006
Replaced
National standards
GB/T 5252-2006 Germanium monocrystal—Inspection of dislocation etch pit density
GB/T 5252-2006 Germanium monocrystal—Inspection of dislocation etch pit density
Basic Information
Standard Code:
GB/T 5252-2006
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Analysis methods for semi-metallic and semiconductor materials
ICS Name:
Comprehensive Testing of Metal Materials
Publish Date:
2006-07-18
Implement Date:
2006-11-01
Pages:
8 pages
Scope
This standard is applicable to the measurement of dislocation density or other defects in n-type and p-type germanium single-crystal rods or wafers with a dislocation density of 0 cm-2 to 100,000 cm-2. The observation surfaces are (111), (100), and (113).
Development Information
Replace the following standards
Superseded by the following standards
Related Standards
GB/T 14140.2-1993
Replaced
GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method
GB/T 15615-1995
Abolished
GB/T 15615-1995 Test method for measuring flexure strength of silicon slices
GB/T 16481-1996
Abolished
GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth
GB/T 1550-1997
Replaced
GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 1553-1997
Replaced