GB/T 15615-1995 Abolished National standards

GB/T 15615-1995 Test method for measuring flexure strength of silicon slices

Publish Date: 1995-07-12 Implement Date: 1996-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 15615-1995

Standard Type: National standards

Standard Status: Abolished

is_force_gb: no

CCS Name: \nTest methods for the performance of metal products

ICS Name: Comprehensive Testing of Metal Materials

Publish Date: 1995-07-12

Implement Date: 1996-02-01

Pages: 12 pages

Development Information

Word Count: 14 Thousand words Pages: 12 pages

Referenced Standards

GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 12964-2018 Monocrystalline silicon polished wafers GB/T 12965-1996 Monocrystalline silicon as cut slices and lapped slices GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers

Related Standards

GB/T 14140.1-1993 Replaced

GB/T 14140.1-1993 Silicon slices and wafers—Measuring of diameter—Optical projecting method

Publish Date: 1993-02-06

GB/T 14140.2-1993 Replaced

GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method

Publish Date: 1993-02-06

GB/T 16481-1996 Abolished

GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth

Publish Date: 1996-07-09

GB/T 1550-1997 Replaced

GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials

Publish Date: 1997-06-03

GB/T 1553-1997 Replaced

GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay

Publish Date: 1997-06-03

GB/T 17473.1-1998 Replaced

GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of solids content

Publish Date: 1998-08-19