GB/T 14140.1-1993
Replaced
GB/T 1553-1997
Replaced
National standards
GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
Basic Information
Standard Code:
GB/T 1553-1997
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
\nTest methods for the physical properties of metals
ICS Name:
Comprehensive Testing of Metal Materials
Publish Date:
1997-06-03
Implement Date:
1997-12-01
Pages:
20 pages
Development Information
Replace the following standards
GB 1553-1979
GB 5257-1985
Superseded by the following standards
Referenced Standards
Adopt standards
ASTM F28:1990
Related Standards
GB/T 14140.2-1993
Replaced
GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method
GB/T 15615-1995
Abolished
GB/T 15615-1995 Test method for measuring flexure strength of silicon slices
GB/T 16481-1996
Abolished
GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth
GB/T 1550-1997
Replaced
GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials
GB/T 17473.1-1998
Replaced