GB/T 4937.2-2006 Active National standards

GB/T 4937.2-2006 Semiconductor devices—Mechanical and climatic test methods—Part 2:Low air pressure

Publish Date: 2006-08-23 Implement Date: 2007-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 4937.2-2006

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor discrete devices

ICS Name: Diode

Publish Date: 2006-08-23

Implement Date: 2007-02-01

Pages: 6 pages

Scope

This section applies to the low-pressure test of semiconductor devices. The purpose of this test is to determine the ability of components and materials to avoid electrical breakdown failure, which is caused by the weakening of the insulation strength of air and other insulating materials when the air pressure decreases. This test is only applicable to devices with an operating voltage exceeding 1,000 V. This test is applicable to all hermetically sealed semiconductor devices. This test is only applicable to the military and space fields.