GB/T 42968.9-2025 Integrated circuits—Measurement of electromagnetic immunity—Part 9:Measurement of radiated immunity—Surface scan method

Scope

This document describes a measurement method for evaluating the impact of near-electric fields, near-magnetic fields, or near-electromagnetic field components on integrated circuits (ICs). This measurement method is intended for use in IC architecture analysis, such as floor planning and power distribution optimization. This measurement method can also be used to measure ICs installed on any circuit board that a scanning probe can access. In some cases, this measurement method can scan not only ICs but also the environment of ICs. To compare the surface scanning immunity of different ICs, it is recommended to use the standard test board specified in IEC 62132-1. This measurement method provides a sensitivity (immunity) map of ICs to near-field disturbances from electric or magnetic fields above them. The performance of the measurement probe and the accuracy of the probe positioning system determine the resolution of the measurement. The maximum frequency expected for this method is 6 GHz. The upper frequency limit can be extended using existing probe technology, but this is beyond the scope of this document. This measurement method uses continuous wave (CW), amplitude modulation (AM), or pulse modulation (PM) signals in the frequency domain.

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