GB/T 42968.5-2025 Active National standards

GB/T 42968.5-2025 Integrated circuits—Measurement of electromagnetic immunity—Part 5:Workbench Faraday cage method

Publish Date: 2025-12-02 Implement Date: 2025-12-02 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 42968.5-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor integrated circuits

ICS Name: Integrated circuits, microelectronics

Publish Date: 2025-12-02

Implement Date: 2025-12-02

Pages: 24 pages

Scope

This document describes a method for measuring the radio frequency immunity of integrated circuits (ICs) installed on standard test boards or printed circuit boards (PCBs) in their final applications against electromagnetic interference.
This document is applicable to ICs that can perform "independent" functions on test boards with small physical dimensions.

Development Information

Word Count: 29 Thousand words Pages: 24 pages

Same series standard

GB/T 42968.3-2025 Integrated circuits—Measurement of electromagnetic immunity—Part 3:Bulk current injection (BCI) method GB/T 42968.9-2025 Integrated circuits—Measurement of electromagnetic immunity—Part 9:Measurement of radiated immunity—Surface scan method

Referenced Standards

GB/T 2900.74-2008 Electrotechnical terminology—Circuit theory GB/T 4365-2003 Electrotechnical terminology—Electromagnetic compatibility GB/T 4365-2024 Electrotechnical terminology—Electromagnetic compatibility GB/T 17626.6-1998 Electromagnetic compatibility—Testing and measurement techniques—Immunity to conducted disturbances, induced by radio-frequency fields GB/T 17626.6-2008 Electromagnetic compatibility—Testing and measurement techniques—Immunity to conducted disturbances,induced by radio-frequency fields GB/T 17626.6-2017 Electromagnetic compatibility—Testing and measurement techniques—Immunity to conducted disturbances,induced by radio-frequency fields GB/T 42968.1-2023 Integrated circuits—Measurement of electromagnetic immunity—Part 1:General conditions and definitions

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