GB/T 3656-1983
Replaced
YS/T 24-2016
Active
Industry standards-Non-ferrous metals
YS/T 24-2016 Test methods for spike of epitaxial layers
YS/T 24-2016 Test methods for spike of epitaxial layers
Basic Information
Standard Code:
YS/T 24-2016
Standard Type:
Industry standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nTest methods for the physical properties of metals
ICS Name:
\nMetal material testing
Publish Date:
2016-04-05
Implement Date:
2016-09-01
Pages:
5 pages
Scope
This standard specifies the inspection method for dicing defects.
This standard is applicable to determining whether there are dicing defects with a height of not less than 4 mm on silicon epitaxial wafers. If there are a relatively small number of dicing defects that are not connected to each other, the number of dicing defects can be counted. This standard cannot measure the height of dicing defects.
Development Information
Replace the following standards
Referenced Standards
Related Standards
GB/T 3657-1983
Replaced
GB/T 3657-1983 Measurement method of direct magnetic properties of soft magnetic alloys
GB/T 3849-1983
Replaced
GB/T 3849-1983 Hardmetals—Rockwell hardness (scale A) test method
GB/T 3850-1983
Replaced
GB/T 3850-1983 Impermeable sintered metal materials and hardmetals—determination of density
GB/T 3851-1983
Replaced
GB/T 3851-1983 Hardmetals—determination of transverse rupture strength
GB/T 4326-1984
Replaced