DZ/T 0101.12-1994
Active
YS/T 15-1991
Abolished
Industry standards-Non-ferrous metals
YS/T 15-1991 Measurement of Silicon Epitaxial Layer and Diffusion Layer Thickness using Grinding and Polishing Staining Method
YS/T 15-1991 Measurement of Silicon Epitaxial Layer and Diffusion Layer Thickness using Grinding and Polishing Staining Method
Basic Information
Standard Code:
YS/T 15-1991
Standard Type:
Industry standards
Standard Status:
Abolished
is_force_gb:
no
CCS Name:
-
ICS Name:
-
Publish Date:
1991-04-26
Implement Date:
1992-06-01
Pages:
5 pages
Development Information
Superseded by the following standards
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