GB/T 46227-2025 Active National standards

GB/T 46227-2025 Test method for transmittance of semiconductor single crystal materials

GB/T 46227-2025 Test method for transmittance of semiconductor single crystal materials

Publish Date: 2025-08-29 Implement Date: 2026-03-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 46227-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: \nMetal material testing

Publish Date: 2025-08-29

Implement Date: 2026-03-01

Pages: 12 pages

Scope

This document describes the measurement method of the transmittance of semiconductor single-crystal materials in the wavelength range of 0.2 μm to 300 μm.
This document is applicable to the determination of the transmittance of semiconductor single-crystal materials such as silicon, germanium, indium phosphide, cadmium selenide, cadmium sulfide, silicon carbide, gallium nitride, gallium oxide, sapphire, and diamond.

Development Information

Word Count: 13 Thousand words Pages: 12 pages

Referenced Standards

GB/T 8170-1987 Rules for rounding off of numberical values GB/T 8170-2008 Rules of rounding off for numerical values & expression and judgement of limiting values GB/T 13962-1992 Optical instruments—Vocabulary GB/T 13962-2009 Optical instruments—Vocabulary GB/T 14264-1993 Semiconductor materials—Terms and definitions GB/T 14264-2009 Semiconductor materials—Terms and definitions GB/T 14264-2024 Terminology of semiconductor materials

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