GB/T 15877-2013 Active National standards

GB/T 15877-2013 Semiconductor integrated circuits—Specification of DIP leadframes produced by etching

Publish Date: 2013-12-31 Implement Date: 2014-08-15 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 15877-2013

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor integrated circuits

ICS Name: Integrated circuits, microelectronics

Publish Date: 2013-12-31

Implement Date: 2014-08-15

Pages: 10 pages

Scope

This standard specifies the technical requirements, test methods, and inspection rules for etched dual-in-line package lead frames (hereinafter referred to as lead frames) of semiconductor integrated circuits.
This standard applies to etched dual-in-line (DIP) package lead frames (gold-plated and silver-plated) of semiconductor integrated circuits. Single-in-line etched lead frames can also be used as a reference for application.

Development Information

Word Count: 18 Thousand words Pages: 10 pages

Replace the following standards

GB/T 15877-1995 Specification of DIP leadframes produced by etching

Referenced Standards

GB/T 2423.60-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test U:Robustness of terminations and integral mounting devices GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 14112-2015 Semiconductor integrated circuits—Specification for stamped leadframes of plastic DIP GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits GB/T 14113-1993 Terminology of packages for semiconductor integrated circuits SJ 20129-1992 Methods for measurement of metallic coating thickness

Related Standards

GB/T 4855-1984 Abolished

GB/T 4855-1984 Families and products of linear amplifier for semiconductor integrated circuits

Publish Date: 1984-12-18

GB/T 3434-1986 Abolished

GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits

Publish Date: 1986-04-02

GB/T 3431.2-1986 Active

GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins

Publish Date: 1986-07-01

GB/T 6648-1986 Active

GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories

Publish Date: 1986-07-31

GB/T 6800-1986 Abolished

GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits

Publish Date: 1986-08-28

GB/T 3435-1987 Abolished

GB/T 3435-1987 Series and products for semiconductor CMOS integrated circuits—Products of families 4000

Publish Date: 1987-01-21