GB/T 3656-1983
Replaced
GB/T 39144-2020
Active
National standards
GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
Basic Information
Standard Code:
GB/T 39144-2020
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Analysis methods for semi-metallic and semiconductor materials
ICS Name:
\nMetal material testing
Publish Date:
2020-10-11
Implement Date:
2021-09-01
Pages:
5 pages
Scope
This standard specifies the secondary ion mass spectrometry test method for the magnesium content in gallium nitride materials.
This standard is applicable to the quantitative analysis of magnesium content in gallium nitride materials, with a measurement range of not less than 5×1014 cm-3.
Development Information
Referenced Standards
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
GB/T 22461-2008 Surface chemical analysis—Vocabulary
GB/T 22461.1-2023 Surface chemical analysis—Vocabulary—Part 1:General terms and terms used in spectroscopy
GB/T 22461.2-2023 Surface chemical analysis—Vocabulary—Part 2:Terms used in scanning probe microscopy
GB/T 32267-2015 Terminology of performance testing for analytical instrument
GB/T 22461.3-2026 Surface chemical analysis—Vocabulary—Part 3:Terms used in optical interface analysis
Related Standards
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Replaced
GB/T 3657-1983 Measurement method of direct magnetic properties of soft magnetic alloys
GB/T 3849-1983
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GB/T 3849-1983 Hardmetals—Rockwell hardness (scale A) test method
GB/T 3850-1983
Replaced
GB/T 3850-1983 Impermeable sintered metal materials and hardmetals—determination of density
GB/T 3851-1983
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GB/T 3851-1983 Hardmetals—determination of transverse rupture strength
GB/T 4326-1984
Replaced