GB/T 4855-1984
Abolished
T/CIE 155-2023
Active
Group standards
T/CIE 155-2023 Non-volatile phase-change memory electrical performance testing method
T/CIE 155-2023 Non-volatile phase-change memory electrical performance testing method
Price:
$ 41.00
Basic Information
Standard Code:
T/CIE 155-2023
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2023-03-20
Implement Date:
2023-03-20
Pages:
28 pages
Scope
This document specifies the electrical performance testing methods for phase-change memory device units, which are divided into device performance testing and device reliability testing. Device performance testing includes current-voltage characteristics, storage window, set-up time, set-up voltage, reset time, reset voltage, and power consumption; device reliability testing includes durability and data retention time. This document is applicable to phase-change memory device units (hereinafter referred to as "devices").
Development Information
Referenced Standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished