GB/T 4855-1984
Abolished
GB/T 39842-2021
Active
National standards
GB/T 39842-2021 Itegrated circuit (IC) card packaging framework
GB/T 39842-2021 Itegrated circuit (IC) card packaging framework
Basic Information
Standard Code:
GB/T 39842-2021
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2021-03-09
Implement Date:
2021-07-01
Pages:
19 pages
Scope
This standard specifies the technical requirements, inspection methods, inspection rules, packaging, storage, and transportation of integrated circuit (IC) card encapsulation frames (hereinafter referred to as IC card encapsulation frames).
This standard applies to IC card encapsulation frames, including contactless IC card encapsulation frames and non-contact IC card encapsulation frames.
Development Information
Referenced Standards
GB/T 2423.51-2020 Environmental testing—Part 2:Test methods—Test Ke:Flowing mixed gas corrosion test
GB/T 16545-2015 Corrosion of metals and alloys—Removal of corrosion products from corrosion test specimens
GB/T 16921-2005 Metallic coatings—Measurement of coating thickness—X-ray spectrometric methods
GB/T 25933-2010 High-purity gold
GB/T 32642-2016 Flat panel displays glass substrate surface roughness measurement method
GB/T 25934-2010(所有部分)
GB/T 2423.2-2001 Environmental testing for electric and electronic products—Part 2:Test methods-Tests B:Dry heat
GB/T 2423.2-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Tests B:Dry heat
GB/T 2423.17-1993 Basic environmental testing procedures for electric and electronic products Test Ka:Salt mist
GB/T 2423.17-2008 Environmental testing for electric and electronic products—Part 2:Test methods—Test Ka:Salt mist
GB/T 2423.17-2024 Environmental testing—Part 2:Test methods—Test Ka:Salt mist
GB/T 2423.50-1999 Environmental testing for electric and electronic products—Part 2:Tests—Test Cy:Damp heat, steady state, accelerated test primarily intended test primarily intended for components
GB/T 2423.50-2012 Environmental testing—Part 2:Test methods—Test Cy:Damp heat,steady state,accelerated test primarily intended for components
GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 3922-1995 Textiles—Testing method for color fastness to perspiration
GB/T 3922-2013 Textiles—Tests for colour fastness—Colour fastness to perspiration
GB/T 13557-1992 Test methods for flexible copper-clad material for printed circuits
GB/T 13557-2017 Test methods for copper-clad material for flexible printed circuits
GB/T 16649.2-1996 Identification cards—Integrated circuit(s) cards with contacts—Part 2:Dimensions and Location of the contacts
GB/T 16649.2-2006 Identification cards—Integrated circuit(s) cards with contacts—Part 2:Dimensions and location of the contacts
GB/T 16649.2-2024 Identification cards—Integrated circuit cards—Part 2:Cards with contacts—Dimensions and location of the contacts
GB/T 17554.1-2006 Identification cards—Test methods—Part 1:General characteristics tests
GB/T 17554.1-2025 Cards and security devices for personal identification—Test methods—Part 1:General characteristics
GB/T 2423.50-2025 Environmental testing—Part 2:Test methods—Test Cy:Damp heat, steady state,accelerated test primarily intended for components
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished