DZ/T 0101.12-1994
Active
SJ 21343-2018
Active
Industry standards-Electronics
SJ 21343-2018 Measuring methods for microwave components and devices's scattering parameter at cryogenic temperature
SJ 21343-2018 Measuring methods for microwave components and devices's scattering parameter at cryogenic temperature
Price:
$ 30
Basic Information
Standard Code:
SJ 21343-2018
Standard Type:
Industry standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
-
ICS Name:
-
Publish Date:
2018-01-18
Implement Date:
2018-05-01
Pages:
6 pages
Scope
This standard specifies the test method for the S-parameters of microwave components in low-temperature environments. This standard is applicable to the S-parameter testing of microwave components (including amplifier chips, field-effect transistors, chip capacitors, chip inductors, and chip resistors) in low-temperature environments.
Development Information
Referenced Standards
GJB 360B-2009
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