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GB/T 4937.42-2023 Active
GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage
Abstract
This document describes the test method for evaluating the ability of semiconductor devices to withstand high-temperature and high-humidity environments.
This document is suitable for evaluating the corrosion resistance of metal interconnects in chip-encapsulated semiconductor devices and other types of packaged semiconductor devices. It can also be used as an accelerated method for detecting electrical leakage caused by moisture penetrating through the passivation layer, as well as various pre-test preparation methods.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.42-2023 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2023-12-01 |
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