GB/T 4937.42-2023 Active National standards

GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage

GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage

Publish Date: 2023-05-23 Implement Date: 2023-12-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: GB/T 4937.42-2023
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Semiconductor discrete devices
ICS Name: Integrated Components of Semiconductor Devices
Publish Date: 2023-05-23
Implement Date: 2023-12-01
Pages: 9 pages

Scope

This document describes the test method for evaluating the ability of semiconductor devices to withstand high-temperature and high-humidity environments.
This document is suitable for evaluating the corrosion resistance of metal interconnects in chip-encapsulated semiconductor devices and other types of packaged semiconductor devices. It can also be used as an accelerated method for detecting electrical leakage caused by moisture penetrating through the passivation layer, as well as various pre-test preparation methods.

Development Information

Word Count: 13 Thousand words Pages: 9 pages

Same series standard

Referenced Standards

IEC 60749-20

Adopt standards

IEC 60749-42:2014

Related Standards

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