GB/T 14264-1993
Replaced
GB/T 4937.42-2023
Active
National standards
GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage
GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage
Basic Information
Standard Code:
GB/T 4937.42-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2023-05-23
Implement Date:
2023-12-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国半导体器件标准化技术委员会(SAC/TC 78)
Pages:
9 pages
Scope
本文件描述了评价半导体器件耐高温高湿环境能力的试验方法。
本文件适用于评价塑封半导体器件和其他类型封装半导体器件的芯片金属化互连耐腐蚀能力。也可作为由于湿气通过钝化层渗透而导致漏电的加速方法，以及多种试验前的预处理方法。
Development Information
Drafting Units:
中国电子科技集团公司第十三研究所、武汉中原电子集团有限公司、安徽俊承科技有限公司、武汉格物芯科技有限公司、河北北芯半导体科技有限公司、深圳基本半导体有限公司
Drafting Persons:
裴选、周勇、崔从俊、何黎、尹丽晶、汪之涵、张魁、和巍巍
Same series standard
GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climate test methods—Part 26:Electrostatic discharge(ESD)sensitivity testing—Human body model(HBM)
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27:Electrostatic discharge (ESD) sensitivity testing—Machine model (MM)
GB/T 4937.31-2023 Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices(internally induced)
GB/T 4937.32-2023 Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices(externally induced)
Referenced Standards
IEC 60749-20
Adopt standards
IEC 60749-42:2014
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active