GB/T 20724-2021 Active
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
Abstract
This document describes the convergent beam electron diffraction method for measuring the thickness of thin crystal samples using transmission electron microscopes/scanning transmission electron microscopes. This document is suitable for measuring the thickness of thin crystal samples with dimensions ranging from tens of nanometers to hundreds of micrometers, and thicknesses ranging from tens of nanometers to hundreds of nanometers. Note: Since the thickness of thin samples in transmission electron microscopes is often uneven, the localized thickness of the sample illuminated by the electron beam is measured using the convergent beam diffraction method.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 20724-2021 |
| CCS | Electrochemical, thermochemical, and optical analytical instruments |
| ICS | Other standards related to analytical chemistry |
| Implement Date | 2022-07-01 |