PDF
GB/T 26074-2010 Active
GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
Abstract
This standard specifies the method of measuring the resistivity of germanium single crystals using the DC four-probe method.
This standard is applicable to measuring the resistivity of germanium single crystals with a sample thickness and a distance from the edge of the sample to any probe endpoint that are both greater than four times the probe spacing, as well as measuring the resistivity of germanium single crystal wafers with a diameter greater than ten times the probe spacing and a thickness less than four times the probe spacing (referred to as wafers). The measurement range is 1×10-3Ω·cm to 1×102Ω·cm.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 26074-2010 |
| CCS | Analysis methods for semi-metallic and semiconductor materials |
| ICS | Other testing methods for metal materials |
| Implement Date | 2011-10-01 |
Price
$ 50
Subtotal
$ 50
Tax
$ 0.00
Order Total (incl. tax)
$ 50