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GB/T 30866-2014
GB/T 30866-2014 Test method for measuring diameter of monocrystalline silicon carbide wafers
Abstract
This standard specifies the method of measuring the diameter of silicon carbide single crystals using micrometers.
This standard is applicable to the measurement of the diameter of silicon carbide single crystals.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 30866-2014 |
| CCS | Compound semiconductor materials |
| ICS | Semiconductor materials |
| Implement Date | 2015-02-01 |
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$ 36
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$ 36
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$ 36