PDF
GB/T 4937.2-2006 Active
GB/T 4937.2-2006 Semiconductor devices—Mechanical and climatic test methods—Part 2:Low air pressure
Abstract
This section applies to the low-pressure test of semiconductor devices. The purpose of this test is to determine the ability of components and materials to avoid electrical breakdown failure, which is caused by the weakening of the insulation strength of air and other insulating materials when the air pressure decreases. This test is only applicable to devices with an operating voltage exceeding 1,000 V. This test is applicable to all hermetically sealed semiconductor devices. This test is only applicable to the military and space fields.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.2-2006 |
| CCS | Semiconductor discrete devices |
| ICS | Diode |
| Implement Date | 2007-02-01 |
Price
$ 42
Subtotal
$ 42
Tax
$ 0.00
Order Total (incl. tax)
$ 42