GB/T 4855-1984
Abolished
T/CIE 126-2021
Active
Group standards
T/CIE 126-2021 Test Method for Magnetic Random Access Memory Chips
T/CIE 126-2021 Magnetic random access memory (MRAM) chip testing method
Price:
$ 20.00
Basic Information
Standard Code:
T/CIE 126-2021
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2021-12-23
Implement Date:
2022-02-10
Pages:
20 pages
Scope
Main technical content: This standard provides terms, test principles, test environments, test equipment, and test procedures for magnetic random-access memory (MRAM) chip testing. This standard is applicable to magnetic random-access memory chip testing and verification of the key performance (reliability and electrical parameters, etc.) of magnetic random-access memory chips.
Development Information
Related Standards
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