GB/T 3656-1983
Replaced
GB/T 44558-2024
Active
National standards
GB/T 44558-2024 Test method for dislocation imaging in Ⅲ-nitride semiconductor materials—Transmission electron microscopy
GB/T 44558-2024 Test method for dislocation imaging in Ⅲ-nitride semiconductor materials—Transmission electron microscopy
Price:
$ 54
Basic Information
Standard Code:
GB/T 44558-2024
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nTest methods for the physical properties of metals
ICS Name:
\nMetal material testing
Publish Date:
2024-09-29
Implement Date:
2025-04-01
Pages:
16 pages
Scope
This document describes the method of testing dislocation imaging in group III nitride semiconductor materials using transmission electron microscopy. This document is applicable to the testing of dislocation imaging in thin films or bulk single crystals of hexagonal group III nitride semiconductors.
Development Information
Referenced Standards
Related Standards
GB/T 3657-1983
Replaced
GB/T 3657-1983 Measurement method of direct magnetic properties of soft magnetic alloys
GB/T 3849-1983
Replaced
GB/T 3849-1983 Hardmetals—Rockwell hardness (scale A) test method
GB/T 3850-1983
Replaced
GB/T 3850-1983 Impermeable sintered metal materials and hardmetals—determination of density
GB/T 3851-1983
Replaced
GB/T 3851-1983 Hardmetals—determination of transverse rupture strength
GB/T 4326-1984
Replaced