GB/T 4855-1984
Abolished
T/CSTM 01003-2023
Active
Group standards
T/CSTM 01003-2023 Electrical Performance Test Method for Phase-Change Memory Devices
T/CSTM 01003-2023 The method for testing the electrical performance of phase change memory
Price:
$ 20.00
Basic Information
Standard Code:
T/CSTM 01003-2023
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic components and information technology
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2023-03-07
Implement Date:
2023-06-07
Pages:
24 pages
Scope
Scope: This document specifies the electrical performance test methods for phase-change memory cell devices, which are divided into device performance testing and device reliability testing. Device performance testing includes current-voltage characteristics, storage window, set-up time, set-up voltage, reset time, reset voltage, and power consumption; device reliability testing includes durability and data retention time. This document is applicable to phase-change memory cell devices (hereinafter referred to as "devices"). Main technical content: This document specifies the electrical performance test methods for phase-change memory cell devices, which are divided into device performance testing and device reliability testing. Device performance testing includes current-voltage characteristics, storage window, set-up time, set-up voltage, reset time, reset voltage, and power consumption; device reliability testing includes durability and data retention time. This document is applicable to phase-change memory cell devices (hereinafter referred to as "devices").
Development Information
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