DB51/T 3207-2024 Active Sichuan ProvinceLocal standards

DB51/T 3207-2024 Microwave Probe Application Specification for Integrated Circuit Test

Publish Date: 2024-12-03 Implement Date: 2024-12-29 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: DB51/T 3207-2024

Standard Type: Local standards

Standard Status: Active

is_force_gb: no

CCS Name: General electronic measuring instruments, equipment, and systems

ICS Name: Electronics, magnetism, and the measurement of electricity and magnetism.

Publish Date: 2024-12-03

Implement Date: 2024-12-29

Scope

This document specifies the classification, application requirements, fault diagnosis, recommendation index, and maintenance needs of microwave probes used for integrated circuit testing (hereinafter referred to as "probes"). This document is applicable to the selection of microwave probes for testing in microwave integrated circuits.