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GB/T 42969-2023 Active
GB/T 42969-2023 Displacement damage test method for components
Abstract
This document describes the test method for displacement damage of components. This document is applicable to optoelectronic integrated circuits and discrete devices, such as charge-coupled devices (CCDs), optoelectronic couplers, image sensors (APSs), photosensitive tubes, etc., for which displacement damage irradiation tests are conducted using protons and neutrons. Displacement damage irradiation tests for other components can be carried out with reference to this document.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 42969-2023 |
| CCS | Semiconductor integrated circuits |
| ICS | Integrated circuits, microelectronics |
| Implement Date | 2024-01-01 |
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