PDF

GB/T 20726-2015

GB/T 20726-2015 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

Available format(s)
PDF
Language(s)
Chinese
Publish Date
2015-10-09

Abstract

This standard specifies the most important performance parameters characterizing the characteristics of X-ray energy dispersive spectrometers (EDS) primarily composed of semiconductor detectors, preamplifiers, and signal processing systems. This standard is only applicable to semiconductor detectors based on the principle of solid-state ionization. This standard stipulates the minimum requirements for the performance parameters of EDS used in conjunction with scanning electron microscopes (SEMs) or electron probe microanalyzers (EPMAs) and the verification methods. As for the actual analysis process, it is already regulated in ISO 22309 [2] and ASTM E1508 [3] and is not within the scope of this standard.

General Product Information

Document Type National standards
Standard Status Replaced
Standard Code GB/T 20726-2015
CCS Basic standards and general methods
ICS Other standards related to analytical chemistry
Implement Date 2016-09-01
Price $ 47
Subtotal $ 47
Tax $ 0.00
Order Total (incl. tax) $ 47

Log In

Contact Us