MT/T 707-1997
Active
GB/T 20726-2015
Replaced
National standards
GB/T 20726-2015 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 20726-2015 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
Basic Information
Standard Code:
GB/T 20726-2015
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Basic standards and general methods
ICS Name:
Other standards related to analytical chemistry
Publish Date:
2015-10-09
Implement Date:
2016-09-01
Pages:
16 pages
Scope
This standard specifies the most important performance parameters characterizing the characteristics of X-ray energy dispersive spectrometers (EDS) primarily composed of semiconductor detectors, preamplifiers, and signal processing systems. This standard is only applicable to semiconductor detectors based on the principle of solid-state ionization. This standard stipulates the minimum requirements for the performance parameters of EDS used in conjunction with scanning electron microscopes (SEMs) or electron probe microanalyzers (EPMAs) and the verification methods. As for the actual analysis process, it is already regulated in ISO 22309 [2] and ASTM E1508 [3] and is not within the scope of this standard.
Development Information
Replace the following standards
Superseded by the following standards
Referenced Standards
ISO 23833
Adopt standards
ISO 15632:2012
Related Standards
GB/T 20724-2006
Replaced
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 20725-2006
Active
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 20726-2006
Replaced
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
LY/T 1082-2008
Replaced
LY/T 1082-2008 Test method for analysis of vegetable tannin extracts
LY/T 1083-2008
Replaced