PDF
T/ZSA 231-2024 Active
T/ZSA 231-2024 The testing method for half-width of X-ray double-crystal swing curve of gallium oxide monocrystalline wafers
Abstract
This document specifies the method of using a dual-crystal X-ray diffractometer to test the swing curve and half-peak width of gallium oxide single crystals. This document is applicable to gallium oxide single crystals grown by the melt method and other methods, as well as single crystals prepared by directional cutting of crystal ingots. Samples of the aforementioned single crystals that have undergone chemical or mechanical polishing are also suitable for this method. This document is applicable to β-phase gallium oxide single crystals.
General Product Information
| Document Type | Group standards |
|---|---|
| Standard Status | Active |
| Standard Code | T/ZSA 231-2024 |
| Implement Date | 1970-01-01 |
Price
$ 29.00
Subtotal
$ 29.00
Tax
$ 0.00
Order Total (incl. tax)
$ 29.00