DZ/T 0101.12-1994
Active
T/ZSA 231-2024
Active
Group standards
T/ZSA 231-2024 The testing method for half-width of X-ray double-crystal swing curve of gallium oxide monocrystalline wafers
T/ZSA 231-2024 The testing method for half-width of X-ray double-crystal swing curve of gallium oxide monocrystalline wafers
Price:
$ 29.00
Basic Information
Standard Code:
T/ZSA 231-2024
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
-
ICS Name:
-
Publish Date:
1970-01-01
Implement Date:
1970-01-01
Scope
This document specifies the method of using a dual-crystal X-ray diffractometer to test the swing curve and half-peak width of gallium oxide single crystals. This document is applicable to gallium oxide single crystals grown by the melt method and other methods, as well as single crystals prepared by directional cutting of crystal ingots. Samples of the aforementioned single crystals that have undergone chemical or mechanical polishing are also suitable for this method. This document is applicable to β-phase gallium oxide single crystals.
Development Information
Related Standards
JJG 204-1980
Active
JJG 204-1980 Meteorological Ventilation Psychrometer
SC 53-1980
Active
SC 53-1980 Transfer blade hydraulic steering gear repair quality standard
DZ 4-1981
Replaced
\nDZ 4-1981 Method for Compiling Product Models of Geological Instrumentation Equipment
SC 69-1982
Active
SC 69-1982 ZSS-12 Flash-type seawater desalination production device technical specifications
SC 72-1982
Active