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GB/T 4060-2007
GB/T 4060-2007 Polycrystalline silicon—Examination method—Vacuum zone-melting on boron
Abstract
This standard is applicable to the inspection of the boron base of polycrystalline silicon rods grown on silicon cores by polycrystalline silicon deposition. The effective range of impurity concentration detected by this standard is: 0.002×10-9 to 100×10-9.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 4060-2007 |
| CCS | Analysis methods for semi-metallic and semiconductor materials |
| ICS | Comprehensive Testing of Metal Materials |
| Implement Date | 2008-02-01 |
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