GB/T 19444-2025 Active National standards

GB/T 19444-2025 Test method for oxygen precipition characteristics of silicon wafers—Interstitial oxygen reduction

GB/T 19444-2025 Test method for oxygen precipition characteristics of silicon wafers—Interstitial oxygen reduction

Publish Date: 2025-06-30 Implement Date: 2026-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 19444-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: \nMetal material testing

Publish Date: 2025-06-30

Implement Date: 2026-01-01

Pages: 12 pages

Scope

This document describes a method for testing the oxygen precipitation characteristics of silicon wafers by measuring the reduction in the amount of interstitial oxygen before and after heat treatment of the wafers.
This document is applicable to the testing of oxygen precipitation characteristics of n-type single-crystal silicon wafers with a room-temperature resistivity greater than 0.1 Ω·cm and p-type single-crystal silicon wafers with a room-temperature resistivity greater than 0.5 Ω·cm.

Development Information

Word Count: 13 Thousand words Pages: 12 pages

Replace the following standards

GB/T 19444-2004 Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction

Referenced Standards

GB/T 1557-2018 Test method for determining interstitial oxygen content in silicon by infrared absorption GB/T 6682-1992 Water for analytical laboratory use—Specification and test methods GB/T 6682-2008 Water for analytical laboratory use—Specification and test methods GB/T 14264-1993 Semiconductor materials—Terms and definitions GB/T 14264-2009 Semiconductor materials—Terms and definitions GB/T 14264-2024 Terminology of semiconductor materials

Related Standards

GB/T 3656-1983 Replaced

GB/T 3656-1983 Measurement methods of magnetic properties of electrical iron

Publish Date: 1983-05-02

GB/T 3657-1983 Replaced

GB/T 3657-1983 Measurement method of direct magnetic properties of soft magnetic alloys

Publish Date: 1983-05-02

GB/T 3849-1983 Replaced

GB/T 3849-1983 Hardmetals—Rockwell hardness (scale A) test method

Publish Date: 1983-09-14

GB/T 3850-1983 Replaced

GB/T 3850-1983 Impermeable sintered metal materials and hardmetals—determination of density

Publish Date: 1983-09-14

GB/T 3851-1983 Replaced

GB/T 3851-1983 Hardmetals—determination of transverse rupture strength

Publish Date: 1983-09-14

GB/T 4326-1984 Replaced

GB/T 4326-1984 Extrinsic semiconductor single crystals—measurement of Hall mobility and Hall coefficient

Publish Date: 1984-04-12