GB/T 25098-2010
Active
GB/T 19444-2004
Replaced
National standards
GB/T 19444-2004 Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction
GB/T 19444-2004 Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction
Basic Information
Standard Code:
GB/T 19444-2004
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Non-destructive testing methods for metals
ICS Name:
Comprehensive analysis of insulating fluids
Publish Date:
2004-02-05
Implement Date:
2004-07-01
Pages:
8 pages
Development Information
Superseded by the following standards
Referenced Standards
GB/T 1557-1989 The method of determining interstitial oxygen content in silicon by infrared absorption
GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption
GB/T 1557-2018 Test method for determining interstitial oxygen content in silicon by infrared absorption
GB/T 14143-1993 300～900μm Silicon slices—Measuring of interstitial oxygen content—Infrared absorption method
GB/T 14144-1993 Test method for determination of radial interstitial oxygen variation in silicon
GB/T 14144-2009 Testing method for determination of radial interstitial oxygen variation in silicon
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