GB/T 3191-1998 Replaced National standards

GB/T 3191-1998 Extrusion rods and bars of aluminium and aluminium alloy

Publish Date: 1998-07-15 Implement Date: 1999-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 3191-1998

Standard Type: National standards

Standard Status: Replaced

is_force_gb: no

CCS Name: Light metals and their alloys

ICS Name: Non-ferrous metals

Publish Date: 1998-07-15

Implement Date: 1999-02-01

Pages: 12 pages

Development Information

Word Count: 22 Thousand words Pages: 12 pages

Replace the following standards

GB 3191-1982 GB 3192-1982 GB 10572-1989

Superseded by the following standards

GB/T 3191-2010 Aluminium and aluminium alloys extruded bars,rods

Referenced Standards

GB/T 228-87 GB/T 3190-1996 Wrought aluminium and aluminium alloys—Chemical composition limits GB/T 3199-1996 Wrought aluminium and aluminium alloy products—Packing, marking, transporting and storing GB/T 3246-82 GB/T 3247-82 GB/T 6395-86 GB/T 6987-87 GB/T 16865-1997 Test pieces for tensile test for wrought aluminum and magnesium alloy products GB/T 17432-1998 Methods of sampling for analysing the chemical composition of wrought aluminum and aluminum alloy

Related Standards

GB/T 6455-1986 abolished_transferred

GB/T 6455-1986 Mercury releasing combined strips for getter

Publish Date: 1986-06-07

GB/T 8549-1987 abolished_transferred

GB/T 8549-1987 Metallic powder material—Self-fluxing Fe-Cr-B-Si alloy powder

Publish Date: 1987-12-30

GB/T 13822-1992 Replaced

GB/T 13822-1992 Test specimens for non ferrous diecasting alloys

Publish Date: 1992-11-05

GB/T 4461-1992 Replaced

GB/T 4461-1992 Thermostatic bimetal strips

Publish Date: 1992-11-16

GB/T 14146-1993 Replaced

GB/T 14146-1993 Silicon epitaxial layers—Determination of carrier concentration—Mercury probe Valtage-capacitance method

Publish Date: 1993-02-06

GB/T 6617-1995 Replaced

GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe

Publish Date: 1995-04-18