GB/T 17473.3-1998 Replaced National standards

GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of sheet resistance

Publish Date: 1998-08-19 Implement Date: 1999-03-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 17473.3-1998

Standard Type: National standards

Standard Status: Replaced

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: Comprehensive Testing of Metal Materials

Publish Date: 1998-08-19

Implement Date: 1999-03-01

Pages: 8 pages

Development Information

Word Count: 7 Thousand words Pages: 8 pages

Same series standard

GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of solids content GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of fineness GB/T 17473.4-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of adhesion GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of viscosity GB/T 17473.6-1998 Test methods of precious metal pastes used for thick-film microelectronics—Determination of resolution GB/T 17473.7-1998 Test methods of precious metal pastes used for thick film microelectronics—Test of solderability and solderleaching resistance

Superseded by the following standards

GB/T 17473.3-2008 Test methods of precious metals pastes used for microelectronics—Determination of sheet resistance

Referenced Standards

GB/T 2421-1989 GB/T 8170-1987 Rules for rounding off of numberical values

Related Standards

GB/T 14140.1-1993 Replaced

GB/T 14140.1-1993 Silicon slices and wafers—Measuring of diameter—Optical projecting method

Publish Date: 1993-02-06

GB/T 14140.2-1993 Replaced

GB/T 14140.2-1993 Silicon slices and wafers—Measuring of diameter—Micrometer method

Publish Date: 1993-02-06

GB/T 15615-1995 Abolished

GB/T 15615-1995 Test method for measuring flexure strength of silicon slices

Publish Date: 1995-07-12

GB/T 16481-1996 Abolished

GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth

Publish Date: 1996-07-09

GB/T 1550-1997 Replaced

GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials

Publish Date: 1997-06-03

GB/T 1553-1997 Replaced

GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay

Publish Date: 1997-06-03