GB/Z 17626.33-2023 Electromagnetic compatibility—Testing and measurement techniques—Part 33:Measurement methods for high-power transient parameters

Scope

This document describes the basic methods and main equipment for measuring the high-power electromagnetic transient response parameters. The main response parameters include the following:
——Electric field (E) and magnetic field (H) (for example, the incident field of the system under test or the superposition field of the incident field and the scattered field);
——Current I (for example, induced by the transient field or within the system under test);
——Voltage U (for example, induced by the transient field or within the system under test);
——Induced charge Q on cables or other conductors.
Note: The charge Q on conductors is a fundamental quantity with definite meaning at any frequency. However, voltage U is a (secondary) quantity with definite meaning only at low frequencies. At high frequencies, voltage cannot be determined by the line integral of the electric field, as this integral depends on the path. Thus, for pulses with very fast rising edges (containing a large amount of high-frequency components), it is not appropriate to use voltage as a measurement quantity. In this case, the charge quantity needs to be measured.
These measurements typically involve complex time-varying waveforms that can be approximated by scalar parameters or "measurable parameters", including:
——Peak value of the response;
——Rise time of the waveform;
——Fall time (or duration) of the waveform;
——Pulse width;
——Norm obtained from the waveform in mathematical terms.
This document provides information on the measurement methods and characteristic parameters of these waveforms, but does not provide information on specific measurement grade requirements.

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