GB/T 4855-1984
Abolished
GB/T 14143-1993
Replaced
National standards
GB/T 14143-1993 300～900μm Silicon slices—Measuring of interstitial oxygen content—Infrared absorption method
GB/T 14143-1993 300～900μm Silicon slices—Measuring of interstitial oxygen content—Infrared absorption method
Basic Information
Standard Code:
GB/T 14143-1993
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Non-destructive testing methods for metals
ICS Name:
Integrated circuits, microelectronics
Publish Date:
1993-02-06
Implement Date:
1993-10-01
Pages:
8 pages
Development Information
Superseded by the following standards
Referenced Standards
GB/T 1557-1989 The method of determining interstitial oxygen content in silicon by infrared absorption
GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption
GB/T 1557-2018 Test method for determining interstitial oxygen content in silicon by infrared absorption
Adopt standards
ASTM F121-83
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished