GB/T 43538-2023 Active National standards

GB/T 43538-2023 Quality and technical requirements for metal packages used for integrated circuits

Publish Date: 2023-12-28 Implement Date: 2024-07-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 43538-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Microcircuit

ICS Name: Integrated circuits, microelectronics

Publish Date: 2023-12-28

Implement Date: 2024-07-01

Pages: 32 pages

Scope

This document specifies the technical requirements and inspection methods for the materials, plating, design and structure, electrical characteristics, appearance quality, and environmental adaptability of integrated circuit metal packaging enclosures.
This document is applicable to the development, production, delivery, and use of integrated circuit metal packaging enclosures (hereinafter referred to as "enclosures").

Development Information

Word Count: 64 Thousand words Pages: 32 pages

Referenced Standards

GB/T 4937.11-2018 Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method GB/T 4937.13-2018 Semiconductor devices—Mechanical and climatic test methods—Part 13:Salt atmosphere GB/T 4937.14-2018 Semiconductor devices—Mechanical and climatic test methods—Part 14:Robustness of terminations(lead integrity） GB/T 4937.21-2018 Semiconductor devices—Mechanical and climatic test methods—Part 21:Solderability GB/T 4937.22-2018 Semiconductor devices—Mechanical and climatic test methods—Part 22:Bond strength IEC 60749-8:2002 IEC 60749-25:2003 IEC 60749-36:2003 GB/T 16526-1996 Test method measuring the lead-to-lead and loading capacitance of package leads GB/T 19248-2003 Test method for measuring the resistance of package leads SJ 20129-1992 Methods for measurement of metallic coating thickness

Related Standards

GB/T 4855-1984 Abolished

GB/T 4855-1984 Families and products of linear amplifier for semiconductor integrated circuits

Publish Date: 1984-12-18

GB/T 3434-1986 Abolished

GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits

Publish Date: 1986-04-02

GB/T 3431.2-1986 Active

GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins

Publish Date: 1986-07-01

GB/T 6648-1986 Active

GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories

Publish Date: 1986-07-31

GB/T 6800-1986 Abolished

GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits

Publish Date: 1986-08-28

GB/T 3435-1987 Abolished

GB/T 3435-1987 Series and products for semiconductor CMOS integrated circuits—Products of families 4000

Publish Date: 1987-01-21