GB/T 12272-1990
Active
GB/T 5095.2502-2021
Active
National standards
GB/T 5095.2502-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-2:Test 25b:Attenuation (insertion loss)
GB/T 5095.2502-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-2:Test 25b:Attenuation (insertion loss)
Basic Information
Standard Code:
GB/T 5095.2502-2021
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Connector
ICS Name:
Plug and socket devices, connectors
Publish Date:
2021-03-09
Implement Date:
2021-10-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国电子设备用机电元件标准化技术委员会(SAC/TC 166)
Pages:
13 pages
Scope
GB/T 5095的本部分适用于电连接器、插座、电缆组件或互连系统。
本部分描述了测量作为频率函数的衰减/插入损耗的频域法和时域法。
注： 本文件从始至终引用了“衰减”一词。当按样品和传输线类型进行测量的专业试验人员总结和报告试验测量结果时，必须使用合适的术语（衰减或插入损耗）。
Development Information
Drafting Units:
四川华丰企业集团有限公司、中国电子技术标准化研究院
Drafting Persons:
庞斌、朱茗、肖淼、刘俊、汪其龙
Same series standard
GB/T 5095.2303-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-3:Screening and filtering tests—Test 23c:Shielding effectiveness of connectors and accessories—Line injection method
GB/T 5095.2304-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-4:Screening and filtering tests—Test 23d:Transmission line reflections in the time domain
GB/T 5095.2307-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-7:Screening and filtering tests—Test 23g:Effective transfer impedance of connectors
GB/T 5095.2501-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-1:Test 25a:Crosstalk ratio
GB/T 5095.2503-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-3:Test 25c: Rise time degradation
GB/T 5095.2504-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-4:Test 25d:Propagation delay
GB/T 5095.2505-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-5:Test 25e:Return loss
GB/T 5095.2507-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-7:Test 25g: Impedance, reflection coefficient,and voltage standing wave ratio (VSWR)
Adopt standards
IEC 60512-25-2:2002
Related Standards
GB/T 15157-1994
Active
GB/T 15157-1994 Connectors for frequencies below 3MHz for use with printed boards Part l:Generic specification—General requirements and guide for the preparation of detail specifications, with assessed quality
GB/T 15176-1994
Active
GB/T 15176-1994 Generic specification for sockets and accessories for electronic plug-in devices
GB/T 15872-1995
Replaced
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 15873-1995
Active
GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification
GB/T 11313-1996
Replaced