GB/T 12272-1990
Active
GB/T 5095.2303-2021
Active
National standards
GB/T 5095.2303-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-3:Screening and filtering tests—Test 23c:Shielding effectiveness of connectors and accessories—Line injection method
GB/T 5095.2303-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-3:Screening and filtering tests—Test 23c:Shielding effectiveness of connectors and accessories—Line injection method
Basic Information
Standard Code:
GB/T 5095.2303-2021
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Connector
ICS Name:
Plug and socket devices, connectors
Publish Date:
2021-03-09
Implement Date:
2021-10-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国电子设备用机电元件标准化技术委员会(SAC/TC 166)
Pages:
11 pages
Scope
GB/T 5095的本部分规定了测量屏蔽连接器或装有屏蔽附件并端接屏蔽电缆而未提供整体屏蔽的连接器屏蔽效果的标准试验方法。
注1： 根据连接器的几何形状，实际上并不能总是实现连续的完全屏蔽。
该试验方法适用于屏蔽连接器和具有屏蔽能力的连接器附件，能试验下列不同结构的连接器:
——圆形连接器；
——矩形连接器；
——印制板连接器；
——连接器屏蔽附件。
注2：附件的定义见IEV 581-24-10。屏蔽附件，即为非屏蔽连接器提供屏蔽功能的附件，可以是能提供电连续性的合适的屏蔽外壳、互配的连接器装置，也可以是自由端电缆连接器外壳和固定端连接器外壳的金属安装表面之间的屏蔽电缆的屏蔽层。自由端连接器外壳上设有电缆屏蔽夹。
该试验方法的原理是利用连接器/附件/电缆组件的固有屏蔽特性，其表面转移阻抗可表示为屏蔽层内的纵向电压与外壳表面的电流之比。
该试验方法基于两个阻抗匹配的回路，测试原理见图1。受试连接器结合在次级回路02中。初级回路01中激活电磁场阻抗匹配的注入线平行布置在受试样品的表面。
该试验方法也适用于测量装有三同轴接触件、带双绞屏蔽电缆、用于数据总线系统的连接器的屏蔽效果。
Development Information
Drafting Units:
四川华丰企业集团有限公司、中国电子技术标准化研究院
Drafting Persons:
庞斌、朱茗、肖淼、刘小凤、汪其龙
Same series standard
GB/T 5095.2304-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-4:Screening and filtering tests—Test 23d:Transmission line reflections in the time domain
GB/T 5095.2307-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-7:Screening and filtering tests—Test 23g:Effective transfer impedance of connectors
GB/T 5095.2501-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-1:Test 25a:Crosstalk ratio
GB/T 5095.2502-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-2:Test 25b:Attenuation (insertion loss)
GB/T 5095.2503-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-3:Test 25c: Rise time degradation
GB/T 5095.2504-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-4:Test 25d:Propagation delay
GB/T 5095.2505-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-5:Test 25e:Return loss
GB/T 5095.2507-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-7:Test 25g: Impedance, reflection coefficient,and voltage standing wave ratio (VSWR)
Referenced Standards
IEC 60050-581
IEC 60512-1
IEC 62153-4-6:2017
Adopt standards
IEC 60512-23-3:2018
Related Standards
GB/T 15157-1994
Active
GB/T 15157-1994 Connectors for frequencies below 3MHz for use with printed boards Part l:Generic specification—General requirements and guide for the preparation of detail specifications, with assessed quality
GB/T 15176-1994
Active
GB/T 15176-1994 Generic specification for sockets and accessories for electronic plug-in devices
GB/T 15872-1995
Replaced
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 15873-1995
Active
GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification
GB/T 11313-1996
Replaced