GB/T 12272-1990
Active
GB/T 5095.2304-2021
Active
National standards
GB/T 5095.2304-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-4:Screening and filtering tests—Test 23d:Transmission line reflections in the time domain
GB/T 5095.2304-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-4:Screening and filtering tests—Test 23d:Transmission line reflections in the time domain
Basic Information
Standard Code:
GB/T 5095.2304-2021
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Connector
ICS Name:
Plug and socket devices, connectors
Publish Date:
2021-03-09
Implement Date:
2021-10-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国电子设备用机电元件标准化技术委员会(SAC/TC 166)
Pages:
11 pages
Scope
GB/T 5095的本部分规定了两种试验方法，通过测量传输线中连接器在时域内的反射，来评定连接器的性能。在这些方法中，受试连接器被视为传输线中具有受控特性阻抗的跃变点。
试验方法A采用精密同轴电缆和半硬同轴电缆与受试连接器和试验设备连接。该试验方法适用于多种形状的连接器或电缆组件。
试验方法B采用精密试验板、精密同轴电缆和半硬同轴电缆与受试连接器和试验设备连接。该试验方法适用于印制板连接器。
Development Information
Drafting Units:
四川华丰企业集团有限公司、中国电子技术标准化研究院
Drafting Persons:
庞斌、朱茗、肖淼、汪其龙、周勇
Same series standard
GB/T 5095.2303-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-3:Screening and filtering tests—Test 23c:Shielding effectiveness of connectors and accessories—Line injection method
GB/T 5095.2307-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-7:Screening and filtering tests—Test 23g:Effective transfer impedance of connectors
GB/T 5095.2501-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-1:Test 25a:Crosstalk ratio
GB/T 5095.2502-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-2:Test 25b:Attenuation (insertion loss)
GB/T 5095.2503-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-3:Test 25c: Rise time degradation
GB/T 5095.2504-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-4:Test 25d:Propagation delay
GB/T 5095.2505-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-5:Test 25e:Return loss
GB/T 5095.2507-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-7:Test 25g: Impedance, reflection coefficient,and voltage standing wave ratio (VSWR)
Adopt standards
IEC 60512-23-4:2001
Related Standards
GB/T 15157-1994
Active
GB/T 15157-1994 Connectors for frequencies below 3MHz for use with printed boards Part l:Generic specification—General requirements and guide for the preparation of detail specifications, with assessed quality
GB/T 15176-1994
Active
GB/T 15176-1994 Generic specification for sockets and accessories for electronic plug-in devices
GB/T 15872-1995
Replaced
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 15873-1995
Active
GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification
GB/T 11313-1996
Replaced