GB/T 12272-1990
Active
GB/T 5095.2503-2021
Active
National standards
GB/T 5095.2503-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-3:Test 25c: Rise time degradation
GB/T 5095.2503-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-3:Test 25c: Rise time degradation
Price:
$ 54
Basic Information
Standard Code:
GB/T 5095.2503-2021
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Connector
ICS Name:
Plug and socket devices, connectors
Publish Date:
2021-03-09
Implement Date:
2021-10-01
Pages:
11 pages
Scope
This part of GB/T 5095 is applicable to electrical connectors, sockets, cable assemblies, or interconnection systems.
This part describes the method of measuring the impact of the sample on the rise time of the signal passing through it.
Development Information
Same series standard
GB/T 5095.2303-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-3:Screening and filtering tests—Test 23c:Shielding effectiveness of connectors and accessories—Line injection method
GB/T 5095.2304-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-4:Screening and filtering tests—Test 23d:Transmission line reflections in the time domain
GB/T 5095.2307-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 23-7:Screening and filtering tests—Test 23g:Effective transfer impedance of connectors
GB/T 5095.2501-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-1:Test 25a:Crosstalk ratio
GB/T 5095.2502-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-2:Test 25b:Attenuation (insertion loss)
GB/T 5095.2504-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-4:Test 25d:Propagation delay
GB/T 5095.2505-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-5:Test 25e:Return loss
GB/T 5095.2507-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-7:Test 25g: Impedance, reflection coefficient,and voltage standing wave ratio (VSWR)
Adopt standards
IEC 60512-25-3:2001
Related Standards
GB/T 15157-1994
Active
GB/T 15157-1994 Connectors for frequencies below 3MHz for use with printed boards Part l:Generic specification—General requirements and guide for the preparation of detail specifications, with assessed quality
GB/T 15176-1994
Active
GB/T 15176-1994 Generic specification for sockets and accessories for electronic plug-in devices
GB/T 15872-1995
Replaced
GB/T 15872-1995 Power supply interface for semiconductor equipment
GB/T 15873-1995
Active
GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification
GB/T 11313-1996
Replaced