GB/T 2413-1981
Active
GB/T 14620-2013
Active
National standards
GB/T 14620-2013 Alumina ceramic substrates for thin film integrated circuits
GB/T 14620-2013 Alumina ceramic substrates for thin film integrated circuits
Basic Information
Standard Code:
GB/T 14620-2013
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic devices and specialized materials, parts, and structural components
ICS Name:
Special materials for electronic technology
Publish Date:
2013-11-12
Implement Date:
2014-04-15
Pages:
13 pages
Scope
This standard specifies the requirements, test methods, inspection rules, marking, packaging, transportation, and storage of alumina ceramic substrates for thin film integrated circuits.
This standard applies to the production and procurement of alumina ceramic substrates for thin film integrated circuits (hereinafter referred to as "substrates"). Alumina ceramic substrates for chip components using thin film technology can also be used for reference.
Development Information
Replace the following standards
Referenced Standards
GB/T 9531.1
GB/T 14619-2013 Alumina ceramic substrates for thick film integrated circuits
GB/T 16534-2009 Fine ceramics(advanced ceramics,advanced technical ceramics)—Test method for hardness of monolithic ceramics at room temperature
GJB 548B-2005
GJB 1201.1-1991
GB/T 1958-2004 Geometrical product Specifications(GPS)—Geometrical tolerance—Verification prescription
GB/T 1958-2017 Geometrical Product Specifications(GPS)—Geometrical tolerance—Verification
GB/T 2413-1981 Piezoelectric ceramic materials—Measuring methods for determination of volume density
GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection
GB/T 2829-2002 Sampling procedures and tables for periodic inspection by attributes (Apply to inspection of process stability)
GB/T 5593-1996 Structure ceramic materials used in electronic components
GB/T 5593-2015 Structure ceramic materials used in electronic component and device
GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion
GB/T 5594.3-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 3:Test method for mean coefficient of linear expansion
GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value
GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device—Part 4:Test method for permittivity and dielectric loss angle tangent value
GB/T 5594.5-1985 Test methods for properties of structure ceramic used in electronic components—Test method for volume resistivity
GB/T 5594.7-1985 Test methods for properties of structure ceramic used in electronic components—Test method for liquid permeability
GB/T 5594.7-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 7:Test method for liquid permeability
GB/T 5598-1985 Test method for thermal conductivity of beryllium oxide ceramics
GB/T 5598-2015 Test method for thermal conductivity of beryllium oxide ceramics
GB/T 6062-2002 Geometrical product specifications (GPS)—Surface texture-Profile method—Nominal characteristics of contact(stylus)instruments
GB/T 6062-2009 Geometrical Product Specifications (GPS)—Surface texture:Profile method—Nominal characteristic of contact (stylus) instruments
GB/T 6900-2006 Chemical analysis of alumina-silica refractories
GB/T 6900-2016 Chemical analysis of alumina-silica refractories
GB/T 6900.1-1986 Fireclay and high-alumina refractories—Determination of loss content on ignition—Gravimetric method
GB/T 6900.2-1986 Fireclay and high-alumina refractories—Determination of silicon dioxide content—Gravimetric-molybdenum blue photometric method
GB/T 6900.3-1986 Fireclay and high-alumina refractories—Determination of iron oxide content—o-Phenanthroline photometric method
GB/T 6900.4-1986 Fireclay and high-alumina refractories—Determination of aluminium oxide content—EDTA volumetric method
GB/T 6900.5-1986 Fireclay and high-alumina refractories—Determination of titanium dioxide content—Hydrogen peroxide photometric method
GB/T 6900.6-1986 Fireclay and high-alumina refractories—Determination of calcium oxide content—EDTA volumetric method
GB/T 6900.7-1986 Fireclay and high-alumina refractories—Determination of magnesium oxide content—Xylidyl blue Ⅰ-CTAB photometric method
GB/T 6900.8-1986 Fireclay and high-alumina refractories—Determination of calcium oxide and magnesium oxide content—Atomic absorption spectrophotometric method
GB/T 6900.9-1986 Fireclay and high-alumina refractories—Determination of potassium oxide and sodium oxide content—Atomic absorption spectrophotometric method
GB/T 6900.10-1986 Fireclay and high-alumina refractories—Determination of manganese oxide content—Ammonium persulfate photometric method
GB/T 6900.11-1986 Fireclay and high-alumina refractories—Determination of phosphorous pentoxide content—Molybdenum blue photometric method
GB/T 6900-2025 Chemical analysis of alumino-silicate refractories
GB/T 2829-2025 Sampling procedures and tables for periodic inspection by attributes(Apply to inspection of process stability)
Related Standards
GB/T 3389.4-1982
Replaced
GB/T 3389.4-1982 Test methods for the properties of piezoelectric ceramics—Longitudinal length extension vibration mode for rod
GB/T 5594.1-1985
Active
GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness
GB/T 5594.2-1985
Active
GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio
GB/T 5594.3-1985
Replaced
GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion
GB/T 5594.4-1985
Replaced