GB/T 14620-1993 Alumina ceramic substrates for thin film integrated circuits

GB/T 14620-2013 Alumina ceramic substrates for thin film integrated circuits

GB 5592 GB 9531 GB/T 1031-1995 Surface roughness parameters and their values GB/T 1031-2009 Geometrical Product Specifications (GPS)—Surface texture:Profile method—Surface roughness parameters and their values GB/T 1958-2004 Geometrical product Specifications(GPS)—Geometrical tolerance—Verification prescription GB/T 1958-2017 Geometrical Product Specifications(GPS)—Geometrical tolerance—Verification GB/T 2413-1981 Piezoelectric ceramic materials—Measuring methods for determination of volume density GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.2-2008 Sampling procedures for inspection by attributes—Part 2:Sampling plans indexed by limiting quality(LQ)for isolated lot inspection GB/T 2828.3-2008 Sampling procedures for inspection by attributes—Part 3:Skip-lot sampling procedures GB/T 2828.4-2008 Sampling procedures for inspection by attributes—Part 4:Procedures for assessment of declared quality levels GB/T 2828.5-2011 Sampling procedures for inspection by attributes—Part 5:System of sequential sampling plans indexed by acceptance quality limit(AQL)for lot-by-lot inspection GB/T 2828.10-2010 Sampling procedures for inspection by attributes—Part 10:Introduction to the GB/T 2828 series of standards for sampling for inspection by attributes GB/T 2828.11-2008 Sampling procedures for inspection by attributes—Part 11:Procedures for assessment of declared quality levels for small population GB/T 2829-2002 Sampling procedures and tables for periodic inspection by attributes (Apply to inspection of process stability) GB/T 5593-1996 Structure ceramic materials used in electronic components GB/T 5593-2015 Structure ceramic materials used in electronic component and device GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion GB/T 5594.3-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 3:Test method for mean coefficient of linear expansion GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device—Part 4:Test method for permittivity and dielectric loss angle tangent value GB/T 5594.5-1985 Test methods for properties of structure ceramic used in electronic components—Test method for volume resistivity GB/T 5598-1985 Test method for thermal conductivity of beryllium oxide ceramics GB/T 5598-2015 Test method for thermal conductivity of beryllium oxide ceramics GB/T 2829-2025 Sampling procedures and tables for periodic inspection by attributes(Apply to inspection of process stability)