YS/T 977-2014 Active Industry standards-Non-ferrous metals

YS/T 977-2014 Carbon/carbon composites heat insulation cylinder of single crystal furnace

YS/T 977-2014 Carbon/carbon composites heat insulation cylinder of single crystal furnace

Publish Date: 2014-10-14 Implement Date: 2015-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 977-2014

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Compound semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 2014-10-14

Implement Date: 2015-04-01

Pages: 8 pages

Scope

This standard specifies the requirements, test methods, inspection rules, marking, packaging, transportation, storage, quality certificates, and order forms (or contracts) for carbon/carbon composite insulation cylinders used in direct-pull single-crystal furnaces.
This standard is applicable to carbon/carbon composite insulation cylinders used in direct-pull single-crystal furnaces, and it is also applicable to carbon/carbon composite insulation cylinders used in other high-temperature vacuum furnaces/protective atmosphere furnaces.

Development Information

Word Count: 14 Thousand words Pages: 8 pages

Referenced Standards

JY/T 015 QJ 2099 GB/T 1804-2000 General tolerances for linear and angular dimensions without individual tolerance indications GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 22588-2008 Determination of thermal diffusivity or thermal conductivity by the flash method GB/T 24528-2009 Carbon materials—Determination method of the bulk density QJ 2509-1993 Carbon/carbon composite material ash content testing method

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31

GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19

GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19

GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28

GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28

GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06