GB/T 17473.2-2008 Replaced National standards

GB/T 17473.2-2008 Test methods of precious metals pastes used for microelectronics—Determination of fineness

GB/T 17473.2-2008 Test methods of precious metals pastes used for microelectronics—Determination of fineness

Publish Date: 2008-03-31 Implement Date: 2008-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 17473.2-2008

Standard Type: National standards

Standard Status: Replaced

is_force_gb: no

CCS Name: Precious metals and their alloys

ICS Name: Other non-ferrous metals and their alloys

Publish Date: 2008-03-31

Implement Date: 2008-09-01

Pages: 8 pages

Scope

This section specifies the method of determining the fineness of noble metal pastes used in microelectronics technology. This section is applicable to the determination of the fineness of noble metal pastes used in microelectronics technology.

Development Information

Word Count: 5 Thousand words Pages: 8 pages

Same series standard

GB/T 17473.1-2008 Test methods of precious metals pastes used for microelectronics—Determination of solids content GB/T 17473.3-2008 Test methods of precious metals pastes used for microelectronics—Determination of sheet resistance GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics—Determination of adhesion GB/T 17473.5-2008 Test methods of precious metals pastes used for microelectronics—Determination of viscosity GB/T 17473.6-2008 Test methods of precious metals pastes used for microelectronics—Determination of resolution GB/T 17473.7-2008 Test methods of precious metals pastes used for microelectronics—Determination of solderability and solderelaching resistance

Replace the following standards

GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics—Determination of fineness

Superseded by the following standards

GB/T 17473-2025 Performance test method for electronic pastes—Conductor pastes test

Referenced Standards

GB/T 8170-1987 Rules for rounding off of numberical values GB/T 8170-2008 Rules of rounding off for numerical values & expression and judgement of limiting values

Related Standards

GB/T 13840-1992 Abolished

GB/T 13840-1992 Wafer carriers

Publish Date: 1992-12-28

GB/T 15677-1995 Replaced

GB/T 15677-1995 Lanthanum metal

Publish Date: 1995-08-11

GB/T 3136-1995 abolished_transferred

GB/T 3136-1995 Tantalum powders

Publish Date: 1995-10-17

GB/T 3463-1995 Abolished

GB/T 3463-1995 Tantalum wires

Publish Date: 1995-10-17

GB/T 3628-1995 Replaced

GB/T 3628-1995 Tantalum and tantalum alloy foils

Publish Date: 1995-10-17

GB/T 16476-1996 Replaced

GB/T 16476-1996 Scandium metal

Publish Date: 1996-07-09