YS/T 1061-2024 Active Industry standards-Non-ferrous metals

YS/T 1061-2024 YS/T 1061-2024 Silicon Nuggets for Polycrystalline Silicon Used in Polysilicon Yield Test Device

YS/T 1061-2024 YS/T 1061-2024 Silicon Nuggets for Polycrystalline Silicon Used in Polysilicon Yield Test Device

Publish Date: 2024-10-24 Implement Date: 2025-05-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 1061-2024

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Element semiconductor materials

ICS Name: Semiconductor materials

Publish Date: 2024-10-24

Implement Date: 2025-05-01

Scope

This document is applicable to silicon cores used as raw materials for the production of silicon polycrystals, which are drawn by the direct pulling method (CZ) or the zone melting method (FZ)

Development Information

Replace the following standards

YS/T 1061-2015 Silicon core for polysilicon by improved siemens method

Related Standards

GB/T 11093-1989 Replaced

GB/T 11093-1989 Liquid encapsulated czochralski-grown gallium arsenide single crystals and As-cut slices

Publish Date: 1989-03-31

GB/T 13388-1992 Replaced

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

Publish Date: 1992-02-19

GB/T 13389-1992 Replaced

GB/T 13389-1992 Practice for conversion between resistivity and dopant density for boron-doped and phosphorus-doped silicon

Publish Date: 1992-02-19

GB/T 13843-1992 Abolished

GB/T 13843-1992 Polished monocrystalline sapphire substrates

Publish Date: 1992-12-28

GB/T 14015-1992 Active

GB/T 14015-1992 Silicon on sapphire epitaxial wafers

Publish Date: 1992-12-28

GB/T 14139-1993 Replaced

GB/T 14139-1993 Silicon epitaxial wafers

Publish Date: 1993-02-06