GB/T 30118-2013 Active National standards

GB/T 30118-2013 Single crystal wafers for surface acoustic wave(SAW) device applications—Specifications and measuring methods

GB/T 30118-2013 Single crystal wafers for surface acoustic wave(SAW) device applications—Specifications and measuring methods

Publish Date: 2013-12-17 Implement Date: 2014-05-15 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 30118-2013

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Quartz crystals, piezoelectric components

ICS Name: \nFrequency control and selection using piezoelectric devices and dielectric devices

Publish Date: 2013-12-17

Implement Date: 2014-05-15

Pages: 31 pages

Scope

This standard specifies the requirements for single-crystal wafers such as artificial quartz, lithium niobate (LN), lithium tantalate (LT), lithium borate (LBO), and lanthanum gallium silicate (LGS).
This standard applies to single-crystal wafers such as artificial quartz, lithium niobate (LN), lithium tantalate (LT), lithium borate (LBO), and lanthanum gallium silicate (LGS). These single-crystal wafers are used as substrate materials for surface acoustic wave (SAW) filters and resonators.

Development Information

Word Count: 56 Thousand words Pages: 31 pages

Referenced Standards

GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 3352-1994 Synthetic quartz crystal GB/T 3352-2012 Synthetic quartz crystal—Specifications and guide to the use GB/T 3505-2000 Geometrical product specifications (GPS)—Surface texture:Profile method—Terms, definitions and surface texture parameters GB/T 3505-2009 Geometrical Product Specifications (GPS)—Surface texture:Profile method—Terms,definitions and surface texture parameters GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices GB/T 3352-2025 Synthetic quartz crystal—Specifications and guidelines for use

Adopt standards

IEC 62276:2005

Related Standards

GB/T 6429-1986 Active

GB/T 6429-1986 The rule of type designation for quartz crystal units

Publish Date: 1986-05-27

GB/T 6430-1986 Active

GB/T 6430-1986 The rule of type designation for crystal holders (enclosures)

Publish Date: 1986-05-27

GB/T 6627-1986 Active

GB/T 6627-1986 Designations for lumbered synthetic quartz crystals

Publish Date: 1986-07-29

GB/T 11387-1989 Replaced

GB/T 11387-1989 Testing method for static flexural strength of piezoelectric ceramics

Publish Date: 1989-07-04

GB/T 12274-1990 Replaced

GB/T 12274-1990 Quartz crystal controlled oscillators—Generic specification for

Publish Date: 1990-02-09

GB/T 12275-1990 Active

GB/T 12275-1990 The rule of type designation for quartz crystal oscillators

Publish Date: 1990-02-09