GB/T 33922-2017 Active National standards

GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances

Publish Date: 2017-07-12 Implement Date: 2018-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 33922-2017

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Microcircuit

ICS Name: Integrated circuits, microelectronics

Publish Date: 2017-07-12

Implement Date: 2018-02-01

Pages: 11 pages

Scope

This standard specifies the terms and definitions, test conditions, general provisions for testing, and testing content and methods of MEMS piezoresistive pressure-sensitive chips (referred to as pressure-sensitive chips). This standard is applicable to wafer-level testing of the performance of closed-loop and open-loop MEMS piezoresistive pressure-sensitive chips.

Development Information

Word Count: 20 Thousand words Pages: 11 pages

Referenced Standards

GB/T 2828.1-2003 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 2828.1-2012 Sampling procedures for inspection by attributes—Part 1:Sampling schemes indexed by acceptance quality limit(AQL) for lot-by-lot inspection GB/T 20522-2006 Semiconductor devices—Part 14-3:Semiconductor sensors—Pressure sensors GB/T 26111-2010 Micro-electromechanical system technology—Terms GB/T 26111-2023 Micro-electromechanical system technology—Terms

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