GB/T 3656-1983
Replaced
GB/T 34210-2017
Active
National standards
GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal
GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal
Basic Information
Standard Code:
GB/T 34210-2017
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nTest methods for the physical properties of metals
ICS Name:
\nMetal material testing
Publish Date:
2017-09-07
Implement Date:
2018-06-01
Pages:
6 pages
Scope
This standard specifies the method of determining the crystal orientation of sapphire single crystals using an X-ray orientation device. This standard is applicable to the determination of the surface orientation of sapphire single crystal materials that are approximately parallel to low-index crystal faces.
Development Information
Referenced Standards
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 14264-1993 Semiconductor materials—Terms and definitions
GB/T 14264-2009 Semiconductor materials—Terms and definitions
GB/T 14264-2024 Terminology of semiconductor materials
JB/T 5482-2011 X-ray crystal orientation apparatus
JB/T 5482-2004 X-ray crystal orientation apparatus technical specification
Related Standards
GB/T 3657-1983
Replaced
GB/T 3657-1983 Measurement method of direct magnetic properties of soft magnetic alloys
GB/T 3849-1983
Replaced
GB/T 3849-1983 Hardmetals—Rockwell hardness (scale A) test method
GB/T 3850-1983
Replaced
GB/T 3850-1983 Impermeable sintered metal materials and hardmetals—determination of density
GB/T 3851-1983
Replaced
GB/T 3851-1983 Hardmetals—determination of transverse rupture strength
GB/T 4326-1984
Replaced